Nexsa G2
Multi-technique XPS system integrating XPS with Raman, REELS, UPS, and ISS for comprehensive surface characterization. Features automated analysis and high throughput.
- Multi-technique: XPS + Raman + REELS + UPS + ISS
- Micro-focused monochromated Al Kα X-ray source
- Spot size: 10 μm to 400 μm
- 128-channel detector for fast imaging
- Automated sample handling
- Advanced Avantage software suite