Material Characterization

XRD — X-Ray Diffraction

Advanced X-ray diffractometers for crystalline phase analysis, material identification, and structural characterization across Egypt.

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XRD Instruments

X-Ray Diffractometers

Choose from our range of Thermo Scientific XRD systems for your material characterization needs.

XRD ARL X'TRA Companion Benchtop XRD

ARL X'TRA Companion

Easy-to-use benchtop X-ray diffractometer for routine phase analysis, offering reliable results with minimal operator intervention. Ideal for quality control and industrial laboratories.

  • Theta/Theta vertical goniometer
  • 5-position sample changer
  • Cu or Co tube configuration
  • Resolution: 0.02° 2θ (FWHM)
  • Compact benchtop design
  • Automated analysis with integrated software
  • Ideal for QA/QC and routine analysis
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